WAFER PROFILER CVP21
The Wafer Profiler CVP21 is a handy tool to measure
doping profiles in semiconductor layers
by Electrochemical Capacitance Voltage Profiling (ECV-Profiling,
CV-Profiling) in semiconductor research or production.
This ECV Profiler (CV-Profiler, C-V-Profiler) furthermore is a very good choice to analyze or develop
strategies for Photo-Electrochemical Wet Etching (PEC-Etching) of
semiconductors.
CVP21
with footprint 60(W)*80(D)*195(H)cm, |
CVP21 is the COMPLETE SOLUTION:
CVP21 supports the COMPLETE spectrum of materials:
CVP21 supports the COMPLETE sample range:
CVP21 supports the COMPLETE resolution range:
(*) may depend on material type/ sample quality. Please ask for sample measurements
CVP21 comes as a COMPLETE measurement system:
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CVP21
as a table-top unit |
CVP21 can be delivered:
CVP21 installation requirements:
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The
benefit list compares our equipment CVP21 to other ECV equipment.
Patents:
DE-10256821, US-7026255 (furthers pending).
Application requirements: |
Our solutions: |
Production applications |
Easy, clear and automatic operation |
Research applications |
High flexibility of the configuration recipes |
Long process times |
Very high reliability |
Huge data streams |
Clear and reliable data storage and backup |
Further information: PDF Flyer (230kB)